WIDE FIELD MICROSCOPE AND METHOD FOR WIDE FIELD MICROSCOPY

摘要

In a method for wide field microscopy, in particular for high-resolution PAL microscopy, wherein a sample field is imaged on a detector surface (13) of a detector (D), the sample field is imaged into an image field (15) which is smaller than the detector surface (13), and the image field (15) on the detector surface (13) is shifted, so that the same sample field is imaged in different positions (15.1 -15.9) located adjacent to one another on the image field in order to determine information about changes in the sample field.