发明名称 |
SUBSTRATE PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To quickly dry a substrate without generating destruction of a pattern formed on the surface of the substrate. <P>SOLUTION: When drying wafers W, first inclination means 33 controls a lifter 8 so that the wafers W are inclined in a direction vertical to the surface of the lifter 8 holding a plurality of wafers W respectively having patterns formed on respective surfaces in a vertical posture in a state that N2 is supplied from an N2 supply nozzle 28. Then, second inclination means 40 controls the lifer 8 so that the lifter 8 is inclined in a direction horizontal to the surfaces of the wafers W. Since a liquid pool 80 left in each pattern groove 72 is allowed to flow into a groove bottom 73 and discharged from a pattern side face 71, remaining liquid can be efficiently discharged. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012209285(A) |
申请公布日期 |
2012.10.25 |
申请号 |
JP20110071303 |
申请日期 |
2011.03.29 |
申请人 |
DAINIPPON SCREEN MFG CO LTD |
发明人 |
MIYAMAWARI HIDEAKI;HONJO ICHIHIRO |
分类号 |
H01L21/304;H01L21/027;H01L21/306 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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