| 摘要 |
A testing module for generating an analog testing signal for a device under test includes a control circuit, a core circuit, and a connector. The core circuit is coupled to the control circuit, and arranged to generate the analog testing signal under control of the control circuit. The connector is coupled to the core circuit, and arranged to receive the analog testing signal generated from the core circuit and output the received analog testing signal. In addition, a testing method for generating an analog testing signal for a device under test includes: generating the analog testing signal by utilizing a testing module with a connector; and outputting the analog testing signal through the connector.
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