发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a circuit for detecting temporarily fluctuating variation which in an integrated circuit. <P>SOLUTION: A detection circuit 100, an arithmetic circuit 101, and a variation/voltage conversion circuit 113 are provided in an integrated circuit. In the detection circuit 100, characteristic variation of the integrated circuit is detected as an oscillation frequency of an output signal of the detection circuit 100. In the arithmetic circuit 101, variation information detected for every time interval regulated by a timer 106 is stored in a register 111, statistical processing is performed by a statistic arithmetic circuit 112, and the temporarily fluctuating characteristic variation of the integrated circuit is detected. The variation/voltage conversion circuit 113 further converts the characteristic variation into voltage information corresponding to the detected characteristic variation. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012209420(A) 申请公布日期 2012.10.25
申请号 JP20110073878 申请日期 2011.03.30
申请人 HITACHI LTD 发明人 ONO TAKEKAZU;SUGANO YUSUKE
分类号 H01L21/822;H01L27/04;H03K19/00 主分类号 H01L21/822
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