发明名称 PATCH INFLUENCE ANALYSIS DEVICE, METHOD AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To determine the influence of patch application by the units of functions in an application. <P>SOLUTION: A patch influence analysis device 1 includes: a dynamic dependency information acquisition part 3 for acquiring, from a test type computer device 2 as the investigation object of the influence of patch application, an access relation which is generated according to the execution of each program in the device 2 in a predetermined period under the operation of the device 2 in association with an access source, access destination, and access occurrence time as dynamic dependency information; a testing operation execution part 4 for executing a predetermined testing operation in an application on a predetermined time under the operation of the device 2; and a patch influence determination part 5 for extracting the information of the access source and access destination which exist within a predetermined neighboring time range on the predetermined time from the dynamic dependency information, and for, when at least one of the access source and the access destination is the object of displacement by the patch application, determining that the access relation in the predetermine testing operation is the presence of the influence of the patch application. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012208879(A) 申请公布日期 2012.10.25
申请号 JP20110075704 申请日期 2011.03.30
申请人 KDDI CORP 发明人 HORI KENJI;YOSHIHARA TAKAHITO
分类号 G06F11/36;G06F11/00;G06F11/28 主分类号 G06F11/36
代理机构 代理人
主权项
地址
您可能感兴趣的专利