发明名称 LIGHT-EMITTING DEVICE INSPECTING APPARATUS AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a light-emitting device inspecting apparatus and method. <P>SOLUTION: A light-emitting device inspecting apparatus for inspecting characteristics of a light-emitting device including one or more light-emission cells that emit light comprises: a probing unit having a table on which the light-emitting device is mounted and probes that supply a current to the light-emitting device; an image obtaining unit for obtaining an image of the light-emitting device; and a determination unit for determining open/short defects of the light-emitting device by detecting a light-emission state of the one or more light-emission cells from brightness information of the obtained image. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012208121(A) 申请公布日期 2012.10.25
申请号 JP20120064090 申请日期 2012.03.21
申请人 SAMSUNG LED CO LTD 发明人 JI WON-SOO;PARK DAE SEO;KIM CHOO-HO
分类号 G01N21/956;G01M11/00;G01N21/88 主分类号 G01N21/956
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