发明名称 |
LIGHT-EMITTING DEVICE INSPECTING APPARATUS AND METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a light-emitting device inspecting apparatus and method. <P>SOLUTION: A light-emitting device inspecting apparatus for inspecting characteristics of a light-emitting device including one or more light-emission cells that emit light comprises: a probing unit having a table on which the light-emitting device is mounted and probes that supply a current to the light-emitting device; an image obtaining unit for obtaining an image of the light-emitting device; and a determination unit for determining open/short defects of the light-emitting device by detecting a light-emission state of the one or more light-emission cells from brightness information of the obtained image. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012208121(A) |
申请公布日期 |
2012.10.25 |
申请号 |
JP20120064090 |
申请日期 |
2012.03.21 |
申请人 |
SAMSUNG LED CO LTD |
发明人 |
JI WON-SOO;PARK DAE SEO;KIM CHOO-HO |
分类号 |
G01N21/956;G01M11/00;G01N21/88 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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