发明名称 MECHANISMS FOR FORMING COPPER PILLAR BUMPS USING PATTERNED ANODES
摘要 This disclosure relates to a bump structure on a substrate including a copper layer, wherein the copper layer fills an opening created in a dielectric layer and a polymer layer. The bump structure further includes an under-bump-metallurgy (UBM) layer lines the opening and the copper layer is deposited over the UBM layer. The bump structure further includes a surface of the copper layer facing away from the substrate is curved. This disclosure also relates to two bump structures with different heights on a substrate where a thickness of the first bump structure is different than a thickness of the second bump structure. This disclosure also relates to a semiconductor device including a bump structure.
申请公布号 US2012267781(A1) 申请公布日期 2012.10.25
申请号 US201213543438 申请日期 2012.07.06
申请人 LU WEN-HSIUNG;CHENG MING-DA;LIN CHIH-WEI;LIU CHUNG-SHI;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LU WEN-HSIUNG;CHENG MING-DA;LIN CHIH-WEI;LIU CHUNG-SHI
分类号 H01L23/488 主分类号 H01L23/488
代理机构 代理人
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