发明名称 |
SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING SYSTEM |
摘要 |
<p>PURPOSE: A semiconductor device, a manufacturing method thereof, and a substrate processing system are provided to prevent or suppress a rise of a threshold voltage by installing a TiAlN layer on a TiN layer. CONSTITUTION: A gate insulation layer(30) is formed on a semiconductor substrate. A TiN layer(40) is formed on the gate insulation layer. A TiAlN layer(43) is formed on the TiN layer. A silicon layer(45) is formed on the TiAN layer.</p> |
申请公布号 |
KR20120117641(A) |
申请公布日期 |
2012.10.24 |
申请号 |
KR20120026075 |
申请日期 |
2012.03.14 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
OGAWA ARITO |
分类号 |
H01L29/78;H01L21/02;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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