发明名称 SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING SYSTEM
摘要 <p>PURPOSE: A semiconductor device, a manufacturing method thereof, and a substrate processing system are provided to prevent or suppress a rise of a threshold voltage by installing a TiAlN layer on a TiN layer. CONSTITUTION: A gate insulation layer(30) is formed on a semiconductor substrate. A TiN layer(40) is formed on the gate insulation layer. A TiAlN layer(43) is formed on the TiN layer. A silicon layer(45) is formed on the TiAN layer.</p>
申请公布号 KR20120117641(A) 申请公布日期 2012.10.24
申请号 KR20120026075 申请日期 2012.03.14
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 OGAWA ARITO
分类号 H01L29/78;H01L21/02;H01L21/336 主分类号 H01L29/78
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