发明名称 Method for fabricating dielectric layer with improved insulating properties
摘要 A method for fabricating a dielectric layer with improved insulating properties is provided, including: providing a dielectric layer having a first resistivity; performing a hydrogen plasma doping process to the dielectric layer; and annealing the dielectric layer, wherein the dielectric layer has a second resistivity greater than that of the first resistivity after annealing thereof.
申请公布号 US8293659(B2) 申请公布日期 2012.10.23
申请号 US201113014562 申请日期 2011.01.26
申请人 QIN SHU;NANYA TECHNOLOGY CORPORATION 发明人 QIN SHU
分类号 H01L21/469 主分类号 H01L21/469
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