发明名称 Methods of manufacturing a semiconductor memory device
摘要 Methods of forming a semiconductor include forming an insulation layer over a semiconductor substrate in which a first region and a second region are defined. A storage node contact (SNC) that passes through the insulation layer is formed and is electrically connected to the first region. A conductive layer that passes through the insulation layer is deposited and is electrically connected to the second region on the insulation layer and the SNC. A bit line is formed by removing an upper portion of the conductive layer, an upper portion of the insulation layer and an upper portion of the SNC until the SNC and the conductive layer are electrically separated from each other, wherein the bit line is a remaining part of the conductive layer.
申请公布号 US8293644(B2) 申请公布日期 2012.10.23
申请号 US20100656969 申请日期 2010.02.22
申请人 JANG SE-MYEONG;KANG MIN-SUNG;SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG SE-MYEONG;KANG MIN-SUNG
分类号 H01L21/44;H01L21/4763 主分类号 H01L21/44
代理机构 代理人
主权项
地址