发明名称 Method for forming silicide contacts
摘要 Contacts having different characteristics may be created by forming a first silicide layer over a first device region of a substrate, and then forming a second silicide layer over a second device region while simultaneously further forming the first silicide layer. A first contact hole may be formed in a dielectric layer over a first device region of a substrate. A silicide layer may then be formed in the first contact hole. A second contact hole may be formed after the first contact hole and silicide layer is formed. A second silicidation may then be performed in the first and second contact holes.
申请公布号 US8294220(B2) 申请公布日期 2012.10.23
申请号 US20100685265 申请日期 2010.01.11
申请人 KIM HYUN-SU;MOON KWANG-JIN;LEE SANG-WOO;LEE EUN-OK;LEE HO-KI;SAMSUNG ELECTRONICS CO. LTD. 发明人 KIM HYUN-SU;MOON KWANG-JIN;LEE SANG-WOO;LEE EUN-OK;LEE HO-KI
分类号 H01L23/50 主分类号 H01L23/50
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