发明名称 RESISTANCE CHANGE MEMORY
摘要 <P>PROBLEM TO BE SOLVED: To provide a resistance change memory capable of sufficiently suppressing a sneak current flowing through a non-selection memory cell without installing a selector in the memory cell. <P>SOLUTION: A resistance change memory includes a memory cell MC having a first electrode 1a, a second electrode 1b, and a variable resistance layer 1c disposed between the first and second electrodes 1a and 1b. The memory cell MC has at least three states. The resistance change memory further includes a control circuit 2 that applies a voltage between the first and second electrodes 1a and 1b to perform writing, deleting, and reading. The control circuit 2 provides a first voltage pulse between the first and second electrodes 1a and 1b during a writing operation. After providing the first voltage pulse, the control circuit 2 provides a second voltage pulse of which polarity is different from that of the first voltage pulse. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012203926(A) 申请公布日期 2012.10.22
申请号 JP20110064933 申请日期 2011.03.23
申请人 TOSHIBA CORP 发明人 ICHIHARA REIKA;FUJII AKISUKE;MATSUSHITA DAISUKE
分类号 G11C13/00;H01L27/105;H01L45/00;H01L49/00 主分类号 G11C13/00
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