| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device and a controlling method thereof capable of executing a performance limit test for a tRP period. <P>SOLUTION: A command decoder 16 includes a first acquiring part for recognizing and holding active operation of a device, a first outputting part for outputting a first output signal outputted by the first acquiring part to a circuit (control circuit 18) of a subsequent stage, a second acquiring part for recognizing and holding inactive operation of the device, and a second outputting part for outputting a second output signal outputted by the second acquiring part to the circuit of the subsequent stage. The first and second acquiring parts acquire and hold a command in accordance with a first transition edge of a synchronizing signal (clock signal CLK), and the first outputting part outputs a first output signal (inACT) in accordance with the first transition edge. The second outputting part outputs a second output signal (inPRE) in accordance with a second transition edge of the synchronizing signal being a transition edge opposite to the first transition edge during test mode operation in which a test mode signal is a second logic. <P>COPYRIGHT: (C)2013,JPO&INPIT |
