发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device that allows the formation of a nitride semiconductor layer with low dislocation and evenness on a substrate having irregularity on its surface, and to provide a method of manufacturing the same. <P>SOLUTION: A semiconductor device comprises: a substrate that has an uneven structure on its primary surface; a nitride layer of at least either of polycrystal and non-crystal that is formed on the entire primary surface and in which at least either of a p-type impurity and an n-type impurity is doped; and a nitride semiconductor layer that is provided on the nitride layer. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012204540(A) |
申请公布日期 |
2012.10.22 |
申请号 |
JP20110066651 |
申请日期 |
2011.03.24 |
申请人 |
TOSHIBA CORP |
发明人 |
AKIYAMA KAZUHIRO;SAKURAI HIDEKI |
分类号 |
H01L33/12;H01L21/205;H01L33/32 |
主分类号 |
H01L33/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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