发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device that allows the formation of a nitride semiconductor layer with low dislocation and evenness on a substrate having irregularity on its surface, and to provide a method of manufacturing the same. <P>SOLUTION: A semiconductor device comprises: a substrate that has an uneven structure on its primary surface; a nitride layer of at least either of polycrystal and non-crystal that is formed on the entire primary surface and in which at least either of a p-type impurity and an n-type impurity is doped; and a nitride semiconductor layer that is provided on the nitride layer. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012204540(A) 申请公布日期 2012.10.22
申请号 JP20110066651 申请日期 2011.03.24
申请人 TOSHIBA CORP 发明人 AKIYAMA KAZUHIRO;SAKURAI HIDEKI
分类号 H01L33/12;H01L21/205;H01L33/32 主分类号 H01L33/12
代理机构 代理人
主权项
地址