发明名称 |
METHOD FOR MANUFACTURING TUNNEL TRANSISTOR |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a tunnel transistor by self-alignment in one lithography step. <P>SOLUTION: A method for manufacturing a tunnel transistor comprises: a step of forming a first insulating film on a semiconductor substrate on which a gate insulating film and a gate electrode are laminated and then forming a second insulating film whose chemical selectivity differs from the first insulating film and which defines a gate electrode position at the edge of the first insulating film by lithography; a step of defining one end of the gate electrode using the first and second insulating films as a mask; a step of introducing a first conductivity-type impurity into the semiconductor substrate to form a source using the first and second insulating films as the mask; a step of coating a third insulating film whose chemical selectivity differs from the first insulating film on the whole surface of the semiconductor substrate; a step of selectively removing the first insulating film by removing a part of the third insulating film; and a step of forming a gate electrode using the second and third insulating films as the mask and then introducing a second conductivity-type impurity into the semiconductor substrate to form a drain. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012204583(A) |
申请公布日期 |
2012.10.22 |
申请号 |
JP20110067536 |
申请日期 |
2011.03.25 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
MORI TAKAHIRO;HORIKAWA TAKESHI |
分类号 |
H01L29/78;H01L21/265;H01L21/266;H01L21/336;H01L29/66 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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