发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device capable of alleviating distortion caused when a wafer is bonded. <P>SOLUTION: A manufacturing method of a semiconductor device comprises: a step of forming a groove in an outer periphery of a chip region on a joint surface of a support substrate; a step of bonding semiconductor substrates respectively having a chip ring in the outer periphery of each chip region inside a dicing line and the support substrate so that the groove is positioned above the chip ring and inside the dicing line; and a step of dicing the bonded semiconductor substrates and the support substrate along the dicing line. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012204543(A) 申请公布日期 2012.10.22
申请号 JP20110066693 申请日期 2011.03.24
申请人 TOSHIBA CORP 发明人 IIJIMA TADASHI
分类号 H01L21/301;H01L27/14;H01L27/146 主分类号 H01L21/301
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