发明名称 MEASURING MACROCELL QUALITY USING FEMTOCELL
摘要 The disclosure is related to measuring macrocell quality of a macrocell using femtocells. A method may be provided for measuring macrocell quality of at least one macrocell using a femtocell base station. The method may include measuring, by the femtocell base station, macrocell quality of at least one macrocell based on event information, generating macrocell quality report information based on a result of the measuring, and transmitting the generated macrocell quality report information to a server through a femtocell gateway. The measuring macrocell quality may include determining whether a macrocell identifier is present in the event information, measuring the macrocell quality of a target macrocell corresponding to the mermen identifier of the event when the macrocell identifier is present in the event information, and measuring the macrocell quality of substantially all neighbor macrocells when the macrocell identifier is absent from the event information.
申请公布号 US2012264419(A1) 申请公布日期 2012.10.18
申请号 US201213447414 申请日期 2012.04.16
申请人 LEE KI-HO;LEE YONG-GYOO;JI YUNG-HA;KT CORPORATION 发明人 LEE KI-HO;LEE YONG-GYOO;JI YUNG-HA
分类号 H04W24/10 主分类号 H04W24/10
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