| 摘要 |
<P>PROBLEM TO BE SOLVED: To prevent incident light other than reflected light from a substrate to an optical path of the reflected light when executing optical measurement. <P>SOLUTION: A component measuring device comprises an optical measurement block 72 including therein a reflected-light path 110 that guides reflected light Lr from a top end to a base end, and a substrate 74 that blocks the reflected-light path 110. The substrate 74 comprises a photo detector 102 to be mounted on a surface of a first flat plate layer 75a, an amplifier 103 to be mounted on a surface of a second flat plate layer 75b, and wiring 128 that electrically connects the photo detector 102 and the amplifier 103 through first and second wiring holes 134, 136. There, the first wiring hole 134 and the second wiring hole 136 are formed in different positions not overlapping each other, so that the first and second wiring holes 134, 136 can be blocked. <P>COPYRIGHT: (C)2013,JPO&INPIT |
