发明名称 |
WAVEFORM ANALYZER, WAVEFORM ANALYSIS METHOD, AND PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a pattern matching having high processing efficiency. <P>SOLUTION: A converter 12 generates a characteristics function which is a logic function that makes a set of a time and a value at the time to be a variable based on a data set row having a set of the time and the value obtained by sampling a signal waveform of an input signal, and converts it into a second function which is an expression in a binary decision diagram. A constrained condition acquisition unit 14 obtains a constrained condition to relationship between time information predetermined by a characteristic point and a value corresponding to the time information in the signal waveform about each of the plurality of the characteristic points set on a reference waveform. This constrained condition is obtained based on the value of the reference waveform in the characteristic point and a predetermined tolerance which is given to the value of the reference waveform. A searching unit 15 obtains a range of a time which satisfies the constrained conditions of all of the plurality of the characteristic points and outputs it by applying the constrained condition of each of the plurality of the characteristic points to the converted second function. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012196250(A) |
申请公布日期 |
2012.10.18 |
申请号 |
JP20110060790 |
申请日期 |
2011.03.18 |
申请人 |
FUJITSU LTD |
发明人 |
TAMIYA YUTAKA;IWASHITA HIROAKI;HIGUCHI HIROYUKI |
分类号 |
A61B5/0452;G01R13/00 |
主分类号 |
A61B5/0452 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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