发明名称 Method for recycling a source substrate
摘要 <p>The method (200) involves applying selective electromagnetic irradiation to a source substrate (210) at a defined wavelength such that damaged material of a surface region of the substrate absorbs the irradiation to facilitate selective removal of regions in relief. The irradiation is controlled by an optical device that detects the regions in relief, so that the irradiation is carried out locally on the detected regions in relief. Chemical-mechanical polishing (220) of the surface region is conducted using a colloidal acid solution that contains an oxidizing agent and/or diamond particles. The selective electromagnetic irradiation of the substrate is carried out by a laser such as pulsed-mode yttrium-aluminum-garnet laser. An independent claim is also included for a method for transferring a layer from a recycled source substrate to a support substrate.</p>
申请公布号 EP2511951(A1) 申请公布日期 2012.10.17
申请号 EP20120154294 申请日期 2012.02.07
申请人 SOITEC 发明人 LECOMTE, MONIQUE;RIGAL, SOPHIE;SOTTA, DAVID;JANIN, FABIENNE;VEYTIZOU, CHRISTELLE;GUENARD, PASCAL
分类号 H01L21/762 主分类号 H01L21/762
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