发明名称 X-RAY ANALYSER
摘要 An x-ray analyser for a transmission electron microscope is described. The analyser has a silicon drift detector moveable in use between an analysis position and a retracted position. The analyser has a housing having an end portion within which the silicon drift detector is retained. The end portion is formed from a material with a relative magnetic permeability of less than 1.004. The analyser also has an automatic retraction system adapted to move the silicon drift detector from the analysis position to the retracted position upon receipt of a trigger signal indicative of a condition in which the power level received by the silicon drift detector from impinging x-rays or electrons is above a predetermined threshold.
申请公布号 EP2510536(A1) 申请公布日期 2012.10.17
申请号 EP20090771580 申请日期 2009.12.07
申请人 OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED 发明人 BEWICK, ANGUS;BHADARE, SANTOKH SINGH
分类号 H01J37/244;H01J37/02;H01J37/26 主分类号 H01J37/244
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