发明名称 Method of manufacturing a photomask
摘要 A photomask is manufactured from a photomask blank comprising a transparent substrate and a light-shielding film consisting of upper and lower layers of transition metal-containing silicon base materials, the content of O+N in the upper layer being higher than that of the lower layer. The light-shielding film is processed in two steps by fluorine dry etching through a resist pattern such that a lower portion of the film is left behind, and oxygen-containing chlorine dry etching for removing the remainder of the film.
申请公布号 EP2261736(A3) 申请公布日期 2012.10.17
申请号 EP20100251082 申请日期 2010.06.11
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 IGARASHI, SHINICHI;INAZUKI, YUKIO;KANEKO, HIDEO;YOSHIKAWA, HIROKI;KINASE, YOSHINORI
分类号 G03F1/00;G03F1/54;H01L21/027 主分类号 G03F1/00
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