发明名称 SPUTTERING TARGET
摘要 <p>Provided is a sputtering target and/or a coil disposed at the periphery of a plasma-generating region for confining plasma. The target and/or the coil has a surface to be eroded having a hydrogen content of 500 µL/cm 2 or less. In dealing with reduction in the hydrogen content of the surface of the target and/or the coil, the process of producing the target and/or the coil, in particular, the conditions for heating the surface of the target and/or the coil, which is thought to be cause of hydrogen occlusion, are appropriately regulated. As a result, hydrogen occlusion at the surface of the target can be reduced, and the degree of vacuum during sputtering can be improved. Thus, the present invention provides a target and/or a coil that has a uniform and fine structure, makes plasma stable, and allows a film to be formed with excellent uniformity and provides a method of producing the target and/or the coil.</p>
申请公布号 KR20120114409(A) 申请公布日期 2012.10.16
申请号 KR20127024844 申请日期 2011.07.27
申请人 JX NIPPON MINING & METALS CORPORATION 发明人 NAGATA KENICHI;MAKINO NOBUHITO
分类号 C23C14/34 主分类号 C23C14/34
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