发明名称 System and method for treating substrate
摘要 A method and system for treating a substrate are provided. The system includes a coating unit, a pre/post-exposure treatment unit, and a developing unit. Each of the units includes a load port and an index module. The pre/post-exposure treatment unit includes first and second modules that are arranged in different layers. The first module performs a process for coating a protective layer on the wafer before an exposure process. The second module performs a process for cleaning the wafer and a post-exposure bake process after the exposure process.
申请公布号 US8289496(B2) 申请公布日期 2012.10.16
申请号 US20100656425 申请日期 2010.01.29
申请人 KIM DONG HO;CHOI JINYOUNG;GO JAESEUNG;HWANG SOOMIN;SEMES CO., LTD. 发明人 KIM DONG HO;CHOI JINYOUNG;GO JAESEUNG;HWANG SOOMIN
分类号 G03B27/32;B05C13/02;G03D5/00 主分类号 G03B27/32
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