| 发明名称 |
METHODE DE TEST POUR DISPOSITIFS ELECTRONIQUES INTEGRES A SEMI-CONDUCTEUR ET ARCHITECTURE DE TEST CORRESPONDANTE |
| 摘要 |
<p>A testing method is described of at least one device provided with an integrated testing circuit and in communication with at least one tester where messages/instructions/test signals/information are exclusively sent from the tester to the device. A testing architecture is also described for implementing this testing method.</p> |
| 申请公布号 |
FR2965645(B1) |
申请公布日期 |
2012.10.12 |
| 申请号 |
FR20100058043 |
申请日期 |
2010.10.05 |
| 申请人 |
STMICROELECTRONICS (GRENOBLE 2) SAS;STMICROELECTRONICS S.R.L. |
发明人 |
PAGANI ALBERTO;BARD JEAN-MICHEL |
| 分类号 |
G06F11/36;G06F15/76;H01L21/66 |
主分类号 |
G06F11/36 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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