发明名称 |
CLEANING RETICLE, METHOD FOR CLEANING RETICLE STAGE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A cleaning reticle, a method for cleaning a reticle stage, and a method for manufacturing a semiconductor device are provided to increase an amount of exposure operations by cleaning a reticle stage in a vacuum stage. CONSTITUTION: A substrate(11) transmits ultraviolet rays. An adhesive material layer(12) is formed on the rear(11a) of the substrate and is hardened by irradiating ultraviolet rays. An alignment mark(13) is formed on the surface(11b) of the substrate. The location of the cleaning reticle is determined by using the alignment mark. |
申请公布号 |
KR20120113205(A) |
申请公布日期 |
2012.10.12 |
申请号 |
KR20120107963 |
申请日期 |
2012.09.27 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
NAKAJIMA YUMI;KYOH SUIGEN;INANAMI RYOICHI |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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