发明名称 |
ELLIPSOMETER FOCUSING SYSTEM |
摘要 |
<p>An ellipsometer includes an integrated focusing system with a beam splitter between the sample and the ellipsometer detector. The beam splitter provides a portion of the radiation to a lens system that magnifies any deviation from a best focus position by at least 2x. The focusing system includes a 2D sensor, where the spot of light focused on the sensor is 50 percent or smaller than the sensor. The focusing system may further include a compensator to correct optical aberrations caused by the beam splitter. A processor receives an image signal and finds the location of the spot from which focus error can be determined and used to correct the focal position of the ellipsometer. The processor compensates for movement of the spot caused by rotating optics. Additionally, a proportional-integral-derivative controller may be used to control exposure time and/or gain of the camera.</p> |
申请公布号 |
WO2012138541(A1) |
申请公布日期 |
2012.10.11 |
申请号 |
WO2012US31222 |
申请日期 |
2012.03.29 |
申请人 |
NANOMETRICS INCORPORATED;BLASENHEIM, BARRY J.;SHACHAF, AMIT |
发明人 |
BLASENHEIM, BARRY J.;SHACHAF, AMIT |
分类号 |
G01N21/21;G02B7/28 |
主分类号 |
G01N21/21 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|