发明名称 Method for Calibrating a Measurement Instrument of an Optronic System
摘要 A method for calibrating measurement instruments of an optronic system in motion, with positions P1, P2, . . . , Pi, . . . , comprises: a device for acquiring images of a scene comprising a fixed object G0; and means for tracking the fixed object G0 during the acquisition of these images; means for obtaining the positions P1, P2, . . . ; at least one instrument for measuring the distance and/or an instrument for measuring angles of orientation and/or of attitude between this measurement instrument and the fixed object G0, according to a line of sight LoS. It comprises the following steps: acquisition at instants t1, t2, . . . of at least two images, each image being acquired on the basis of different positions P1, P2, . . . of the system, the fixed object G0 being sighted in each image, but its position being unknown; acquisition at the instants t′1, t′2, . . . of measurements of distance and/or of angle; synchronization of the measurements of distance and/or of angle with the positions P1, P2, . . . established at instants t1, t2, . . . ; estimation of the measurement defects which minimize the dispersion of at least two points of intersection Gij between the LoS at the position Pi and the LoS at the position Pj, as a function of said measurements and of the known positions Pi, Pj of the system.
申请公布号 US2012257050(A1) 申请公布日期 2012.10.11
申请号 US201013516731 申请日期 2010.12.13
申请人 SIMON ALAIN;THALES 发明人 SIMON ALAIN
分类号 H04N17/00;H04N7/18 主分类号 H04N17/00
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