| 摘要 |
A non-contact magnetic particle inspection apparatus includes a test article support and manipulation system having a first rail that extends along a first axis, a second rail that extends along the first axis, and a third rail that extends a second axis. The third rail includes a first end that extends to a second end through an intermediate portion. The first end is mounted to the first rail and the second end is mounted to the second rail. A mounting fixture is mounted to the third rail. The mounting fixture includes a test article mounting system and a test article orientation system. The test article orientation system is configured and disposed to selectively manipulate a test article within a magnetic field. |
