发明名称 METHOD OF MANUFACTURING ELECTRONIC COMPONENT, MARKING METHOD, AND MARKING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a marking which is applicable to an electronic component placed under a severe environment. <P>SOLUTION: A method of manufacturing an electronic component is provided, which includes an applying step (steps S4, S9) of applying ink 45 having light-curing property and containing &ge;5 mass% and &le;20 mass% N-vinyl caprolactam onto a semiconductor chip 12 being the electronic component to perform marking, an irradiation step (S3-S6, S8-S11) of irradiating the applied ink 45 with light at a cumulative light dose of &ge;200 mJ/cm<SP POS="POST">2</SP>, and a heating step (step S15) of heating the ink 45 at &ge;150&deg;C and &le;200&deg;C after the irradiation step. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012192356(A) 申请公布日期 2012.10.11
申请号 JP20110059057 申请日期 2011.03.17
申请人 SEIKO EPSON CORP 发明人 OTAKE MASAHISA
分类号 B05D7/00;B05C9/14;B05D1/32;B05D7/24;H01L23/00 主分类号 B05D7/00
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