发明名称 IMPACT TESTING APPARATUS WITH DOUBLE HAMMERING PREVENTION MECHANISM AND DOUBLE HAMMERING PREVENTION METHOD FOR IMPACT TESTING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an impact testing apparatus comprising a mechanism for preventing an object to be measured from being brought into contact with a hammer again after excitation. <P>SOLUTION: An impact testing apparatus includes a plate for fixing an object to be measured on the upper surface thereof and a hammer for striking a lower surface of the plate. In the impact testing apparatus, when the hammer strikes the plate, the plate moves up, reaches a top dead point and then falls down by free fall. The impact testing apparatus further includes restriction means for restricting the fall of the plate. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012193969(A) 申请公布日期 2012.10.11
申请号 JP20110056214 申请日期 2011.03.15
申请人 NEC CORP 发明人 SUGANO YUUTAI
分类号 G01M7/08 主分类号 G01M7/08
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