发明名称 SEMICONDUCTOR ELEMENT DESTRUCTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor element destruction device capable of easily and surely destroying a semiconductor element mounted on a storage device or equipment. <P>SOLUTION: In the semiconductor element destruction device 1 has each of a high voltage generation circuit 2, a display device 5, a power source circuit 9, a lifting device 23 and a lock device 40 connected to a control circuit 7 with the control circuit 7 as a center, the high voltage generation circuit 2 is a circuit which becomes a main part of the semiconductor element destruction device 1 and can generate a high voltage pulse, has a pair of discharge terminals 3 and 4 connected thereto, and can discharge the high voltage pulse in a state a storage device or equipment is positioned between the discharge terminal 3 and the discharge terminal 4. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012194734(A) 申请公布日期 2012.10.11
申请号 JP20110057572 申请日期 2011.03.16
申请人 RE BIRTH INC 发明人 KOMORI KAZUSHIGE;HIGASHIGUCHI AKIRA
分类号 G06K17/00;B09B5/00;G06F21/24 主分类号 G06K17/00
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