| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of making application execution more efficient, and a method for controlling the same. <P>SOLUTION: The semiconductor integrated circuit includes a processor having a scan chain, a processor control unit for causing the processor to execute an application, and a scan test control unit for controlling the scan test of the processor. When a scan test interruption request is received from the processor control unit during the execution of the scan test by the scan test control unit, the scan test is interrupted and, after the execution of the application, the scan test is resumed. <P>COPYRIGHT: (C)2013,JPO&INPIT |
