METHODS, APPARATUSES AND COMPUTER PROGRAMS FOR CRYSTALLOGRAPHY

摘要

An apparatus is provided for analysing divergent radiation emanating from a point within a specimen under investigation and determining crystallographic parameters. The apparatus comprises a guide, extending from a planar radiation-sensing surface to an aperture, the aperture lying in a plane parallel to the plane of the radiation-sensing surface, wherein the aperture and the base are non-concentric when viewed in a direction perpendicular to the plane of the aperture. Embodiments of the present invention also provide methods and computer programs for calibrating the apparatus.