发明名称 INSPECTION METHOD FOR IC FOR SECONDARY BATTERY PROTECTION
摘要 <P>PROBLEM TO BE SOLVED: To shorten inspection time for an overcharge detection voltage inspection for an IC for secondary battery protection. <P>SOLUTION: An IC for secondary battery protection comprises an overcharge detection circuit for detecting overcharge of a secondary battery, and a delay circuit for delaying overcharge detection time in a predetermined period of delay time. A voltage lower than a designed value of an overcharge detection voltage is supplied to a power supply voltage terminal of the IC for secondary battery protection. The voltage of the power supply voltage terminal is gradually increased at a time interval shorter than overcharge detection delay time while a current value of the power supply voltage terminal is monitored. When a predetermined current value variation is obtained by the power supply voltage terminal, the voltage supplied to the power supply voltage terminal is detected as the overcharge detection voltage. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012195992(A) 申请公布日期 2012.10.11
申请号 JP20110056014 申请日期 2011.03.14
申请人 RICOH CO LTD 发明人 HASHIMOTO HIROSHI
分类号 H02J7/00;H01M10/48 主分类号 H02J7/00
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