发明名称 |
METHODS OF FORMING BONDED SEMICONDUCTOR STRUCTURES INCLUDING TWO OR MORE PROCESSED SEMICONDUCTOR STRUCTURES CARRIED BY A COMMON SUBSTRATE, AND SEMICONDUCTOR STRUCTURES FORMED BY SUCH METHODS |
摘要 |
<p>PURPOSE: A method for forming a bonded semiconductor structure including two or more processed semiconductor structures supported by a common substrate and the semiconductor structure formed thereby are provided to form s tight contact area between two surfaces by reducing surface roughness to an atomic scale value by polishing bonding surfaces. CONSTITUTION: A semiconductor material layer(104) includes single crystalline silicon, germanium, or III-V semiconductor materials. The semiconductor material layer includes an epitaxial layer consisting of the semiconductor material. The semiconductor material layer is formed on a base(106). The base is formed into a multilayer structure of including two or more different materials. The semiconductor material layer is bonded to an electric insulating material layer(105) at temperature of about 400°C or less.</p> |
申请公布号 |
KR20120112270(A) |
申请公布日期 |
2012.10.11 |
申请号 |
KR20120033825 |
申请日期 |
2012.04.02 |
申请人 |
SOITEC |
发明人 |
SADAKA MARIAM |
分类号 |
H01L25/16;H01L21/77;H01L27/00 |
主分类号 |
H01L25/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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