| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a scanning microscopic light scattering measurement/analysis device for selecting suitable relaxation data from relaxation data of a sample obtained at multipoint by scanning measurement and accurately measuring an ensemble average, and to provide a light scattering analysis method. <P>SOLUTION: The scanning microscopic light scattering measurement/analysis device includes: threshold setting means for setting a threshold whether or not relaxation data of time average correlation function-correlation time based on scattering light 7 detected on each sample position scanned by a scanning mechanism 6 is to be adopted as relaxation data for calculating an ensemble average correlation function based on an amplitude level caused by an abnormal phenomenon; and relaxation data selection means for selecting whether or not the relaxation data of the time average correlation function-correlation time on each sample position scanned by the scanning mechanism 6 is to be adopted as the relaxation data for calculating the ensemble average correlation function based on the threshold set by the threshold setting means. <P>COPYRIGHT: (C)2013,JPO&INPIT |
