发明名称 SEMICONDUCTOR DEVICE AND ELECTRONIC APPLIANCE
摘要 <P>PROBLEM TO BE SOLVED: To manufacture a semiconductor device including an oxide semiconductor with high productivity and at low cost by reducing the number of exposure masks to simplify a photolithography process. <P>SOLUTION: A manufacturing method for a semiconductor device including a channel-etched inverted-staggered thin film transistor includes a process of etching an oxide semiconductor film and a conductive film with a mask layer formed using a multi-gradation mask, which is an exposure mask allowing transmitted light to have a plurality of intensities. In the etching process, a first etching process employs dry etching in which etching gas is used and a second etching process employs wet etching in which etching liquid is used. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012195621(A) 申请公布日期 2012.10.11
申请号 JP20120160719 申请日期 2012.07.19
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ITO SHUNICHI;HOSOHANE MIYUKI;SUZAWA HIDEOMI;SASAGAWA SHINYA;MURAOKA TAIGA
分类号 H01L29/786;G02F1/1368;H01L21/28;H01L21/3065;H01L21/336;H01L29/41;H01L29/417;H01L51/50 主分类号 H01L29/786
代理机构 代理人
主权项
地址