发明名称 |
SEMICONDUCTOR DEVICE AND ELECTRONIC APPLIANCE |
摘要 |
<P>PROBLEM TO BE SOLVED: To manufacture a semiconductor device including an oxide semiconductor with high productivity and at low cost by reducing the number of exposure masks to simplify a photolithography process. <P>SOLUTION: A manufacturing method for a semiconductor device including a channel-etched inverted-staggered thin film transistor includes a process of etching an oxide semiconductor film and a conductive film with a mask layer formed using a multi-gradation mask, which is an exposure mask allowing transmitted light to have a plurality of intensities. In the etching process, a first etching process employs dry etching in which etching gas is used and a second etching process employs wet etching in which etching liquid is used. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012195621(A) |
申请公布日期 |
2012.10.11 |
申请号 |
JP20120160719 |
申请日期 |
2012.07.19 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ITO SHUNICHI;HOSOHANE MIYUKI;SUZAWA HIDEOMI;SASAGAWA SHINYA;MURAOKA TAIGA |
分类号 |
H01L29/786;G02F1/1368;H01L21/28;H01L21/3065;H01L21/336;H01L29/41;H01L29/417;H01L51/50 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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