发明名称 Integrated Circuitry, Methods of Forming Memory Cells, and Methods of Patterning Platinum-Containing Material
摘要 Some embodiments include methods of patterning platinum-containing material. An opening may be formed to extend into an oxide. Platinum-containing material may be formed over and directly against an upper surface of the oxide, and within the opening. The platinum-containing material within the opening may be a plug having a lateral periphery. The lateral periphery of the plug may be directly against the oxide. The platinum-containing material may be subjected to polishing to remove the platinum-containing material from over the upper surface of the oxide. The polishing may delaminate the platinum-containing material from the oxide, and may remove the platinum-containing material from over the oxide with an effective selectivity for the platinum-containing material relative to the oxide of at least about 5:1. Some embodiments include methods of forming memory cells. Some embodiments include integrated circuitry having platinum-containing material within an opening in an oxide and directly against the oxide.
申请公布号 US2012256150(A1) 申请公布日期 2012.10.11
申请号 US201113083354 申请日期 2011.04.08
申请人 ZAGREBELNY ANDREY V.;CARTER CHET E.;MICRON TECHNOLOGY, INC. 发明人 ZAGREBELNY ANDREY V.;CARTER CHET E.
分类号 H01L45/00;B05D3/00;B05D5/00;B05D5/12;H01L21/8239 主分类号 H01L45/00
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