发明名称 MEMORY DEVICE
摘要 <p>PURPOSE: A memory device is provided to reduce an occupied area of a memory cell by forming a cell transistor using a sidewall portion of a groove portion formed in an insulating layer. CONSTITUTION: A bit line(120a) is formed on a substrate(100). A first insulation layer(210) is formed on the bit line. A contact plug(170) is electrically connected to the bit line. A second insulation layer(220) has a groove portion formed on the first insulation layer. An electrode(130) is formed on an upper side of the second insulation layer.</p>
申请公布号 KR20120112230(A) 申请公布日期 2012.10.11
申请号 KR20120033208 申请日期 2012.03.30
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KATO KIYOSHI;SAITO TOSHIHIKO
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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