发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technology for reducing parasitic capacitance occurring between circuit elements and conductive lines disposed on a front side of a substrate, and electronic circuits disposed on a reverse side of the substrate, in a semiconductor device. <P>SOLUTION: A semiconductor device comprises: a substrate; a pixel array disposed on the substrate; a first conductive pad disposed on the substrate and electrically connected with circuit elements of the pixel arrays; a second conductive pad disposed under the substrate for connecting the electronic circuits; an insulation layer disposed between the substrate and the first conductive pad; a third conductive pad disposed between the substrate and the insulation layer; a first conductive member connecting the first conductive pad with the third conductive pad through a first contact hole penetrating the insulation layer; and a second conductive member connecting the second conductive pad with the third conductive pad through a second contact hole penetrating the substrate. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012195509(A) |
申请公布日期 |
2012.10.11 |
申请号 |
JP20110059656 |
申请日期 |
2011.03.17 |
申请人 |
CANON INC |
发明人 |
WAYAMA HIROSHI;MOCHIZUKI CHIORI;WATANABE MINORU;YOKOYAMA KEIGO;OFUJI MASAHITO;KAWANABE JUN;FUJIYOSHI KENTARO |
分类号 |
H01L27/14;G01T1/24;H01L27/144;H01L27/146;H01L31/09;H04N5/32;H04N5/369 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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