| 摘要 |
A method for inspecting sealing defects of a container using infrared light, which can be carried out to inspect all of containers in a non-contact and non-destructive manner using a comparatively inexpensive apparatus, even if it is not just after a heat sealing operation. For this purpose, the infrared light in a wavelength range of 1450nm±20nm is irradiated from a phototransmitter onto the sealed portion of a sample container. The infrared light reflected from or transmitted through the sealed portion of the sample container is received by a photoreceiver 8, and transmitted to a photodetector 10 through an optical fiber 9. The photodetector 10 outputs a voltage according to an amount of the infrared light transmitted thereto, and the voltage thus outputted is then converted into an analog voltage value and further transmitted to a controller 12. The controller 12 sets a threshold based on the analog voltage value transmitted thereto. Then, the infrared light in a same wavelength range as the case of inspecting the sample container is irradiated onto the sealed portion of a container to be inspected. The infrared light reflected from or transmitted through the sealed portion of the inspected container is also converted into the analog voltage value and transmitted to the controller 12. If the infrared light is reduced to be smaller than the threshold set on the basis of the sample container, the sealed portion of the inspected container is judged as a sealing defect. |
