SEMICONDUCTOR DEVICE AND TEST METHOD FOR THE SEMICONDUCTOR DEVICE

摘要

PURPOSE: A semiconductor device and a test method thereof are provided to find faults regardless of direction by arranging a first-1 metal pattern and a first-2 metal pattern in a different direction. CONSTITUTION: A first-1 metal pattern includes a first bent part(112). A first-2 metal pattern(120) is formed on a first metal level. A via structure(160) is electrically connected to one of the first-1 metal pattern and the first-2 metal pattern. A second metal pattern(170) is formed on a second metal level different from the first metal level. The second metal pattern is electrically connected to the via structure.