发明名称 A TEST CHAMBER FOR EMISSION OF NANOPARTICLES FROM NANOPRODUCTS
摘要 PURPOSE: A test chamber for testing an emission amount of a nano product is provided to evaluate possibilities of emitting a nano material being exposed to users in an actual usage environment and utilize a testing result as basic information for designing a safe nano product. CONSTITUTION: A test chamber for testing an emission amount of a nano product comprises a nano product mounting unit, a clean air feeding unit(60), an air discharge port(70), a sampling unit(80), an emitting unit(91). The clean air feeding unit comprises a purge air supplying unit minimizing pollution caused by indoor particles generated when mounting a specimen of a nano product. A speed of an air jet can be changed by changing the diameter of a nozzle in an emission mode by the air jet. A continuous jet or pulse jets of various periods can be utilized by controller a rotation speed of a rotating chopper or an opening/closing period of a solenoid valve in the emission mode by the air jet. [Reference numerals] (50) Nano product specimen mounting unit; (61) Clean air supplying device; (62) Flow rate controlling device; (70) Air discharge port; (80) Nano particle sampling unit; (81) Nano particle measuring device and sampler; (91) Air jet oscillation unit; (AA) Vibration; (BB) Impact; (CC) Rubbing
申请公布号 KR20120111213(A) 申请公布日期 2012.10.10
申请号 KR20110029596 申请日期 2011.03.31
申请人 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 BAE, GWI NAM;LEE, SEUNG BOK;JUNG, JAE HEE;JIN, HYOUN CHER;PARK, SEUNG HO
分类号 G01N15/10;B82Y35/00;G01N1/22;G01N35/00 主分类号 G01N15/10
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