发明名称 Semiconductor device and method
摘要 <p>A method is described for manufacturing a semiconductor device, comprising the steps of providing a substrate (1), providing a first epitaxial semiconducting layer (3) on top of the substrate (1), and forming a one- or two-dimensional repetitive pattern, each part of the pattern having an aspect ratio in the range 0,1 to 50. A corresponding semiconductor device, electronic circuit and apparatus is also disclosed.</p>
申请公布号 EP2509120(A1) 申请公布日期 2012.10.10
申请号 EP20120162196 申请日期 2012.03.29
申请人 IMEC 发明人 CHENG, KAI;CAYMAX, MATTY
分类号 H01L33/24;H01L21/02;H01L33/30 主分类号 H01L33/24
代理机构 代理人
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