SMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要
PURPOSE: A semiconductor device for high integration and a manufacturing method thereof are provided to have high reliability by preventing the recess of a first element isolation pattern including a first insulating pattern made of nitride. CONSTITUTION: A first insulating pattern(132) is made of silicon nitride. A second liner pattern(124) covers a sidewall and a bottom surface of a second trench(114). The second liner pattern is made of same material as a first liner pattern. A second insulating pattern(144) is contacted to the second liner pattern. The second insulating pattern is made of different material as the first insulating pattern.
申请公布号
KR20120110878(A)
申请公布日期
2012.10.10
申请号
KR20110029043
申请日期
2011.03.30
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
BYUN, KYUNG MUN;CHOI, BYOUNG DEOG;HONG, EUN KEE;KANG, MAN SUG