发明名称 INSPECTION APPARATUS, MEASUREMENT METHOD FOR THREE-DIMENSIONAL SHAPE, AND PRODUCTION METHOD FOR STRUCTURE
摘要 Due to a restriction in resolution and the like, it was sometimes difficult to detect small flaws and holes. Accordingly, an aspect of an inspecting apparatus exemplifying the present invention includes a profile measuring part (21, 13, 205, 206) measuring a profile of an object surface (11) and an image detecting part (205, 206, 27) detecting a light intensity distribution of the object surface by illuminating the object surface from mutually different plurality of directions.
申请公布号 EP2508871(A1) 申请公布日期 2012.10.10
申请号 EP20100832824 申请日期 2010.11.18
申请人 NIKON CORPORATION 发明人 AOKI, HIROSHI
分类号 G01N21/956;G01N21/88 主分类号 G01N21/956
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