THREE DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES AND METHODS OF FABRICATING THE SAME
摘要
<p>PURPOSE: A 3D semiconductor memory device and manufacturing method thereof are provided to prevent the resistance of an electrode by minimizing the etching loss of the highest electrode. CONSTITUTION: An electrode structure includes stacked electrodes and an insulating pattern. A work electrode includes a first outer sidewall and a second outer sidewall facing each other. A vertical active pattern(120) passes through the electrode structure. An electrode dielectric layer(170) is interposed between each electrode. The electrode dielectric layer is located between the sidewalls of the vertical active pattern.</p>
申请公布号
KR20120110452(A)
申请公布日期
2012.10.10
申请号
KR20110028320
申请日期
2011.03.29
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LEE, SUNG HAE;KIM, JIN GYUN;YEO, CHA DONG;JANG, DAE HYUN;HWANG, KI HYUN