发明名称 |
METHOD FOR MANUFACTURING SINGLE CRYSTAL INGOT AND SINGLE CRYSTAL INGOT, WAFER MANUFACTURED BY THE SAME |
摘要 |
PURPOSE: A method for manufacturing a single crystalline ingot, and the single crystalline ingot and a wafer manufactured thereby are provided to make the single crystalline ingot and the wafer of high quality grow by controlling RRG(Radial Resistivity Gradient) within 5%. CONSTITUTION: A first area(110) has a resistance value within 0.0001Ω-cm with a center. A second area(120) has a resistance value higher than the first area as 0.0001Ω-cm. A third area(130) has a resistance value higher than the second area as 0.0001Ω-cm. A fourth area(140) has a resistance value higher than the third area. The uniformity inside a cross section of a single crystalline ingot is controlled within 3%. The interface of the single crystalline ingot and silicon ablative corrosion is controlled to 3 to 10mm.
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申请公布号 |
KR20120109865(A) |
申请公布日期 |
2012.10.09 |
申请号 |
KR20110027632 |
申请日期 |
2011.03.28 |
申请人 |
LG SILTRON INCORPORATED |
发明人 |
KIM, SANG HEE;HWANG, JUNG HA;CHOI, YOUNG KYU;SIM, BOK CHEOL |
分类号 |
C30B15/20;C30B29/06;H01L21/02 |
主分类号 |
C30B15/20 |
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