| 摘要 |
A multichip device, which achieves a normal operation and a testing operation without the needs for terminals dedicated for the testing and/or an interposer substrate, is provided. The peripheral chip also includes a switching unit for providing a switching between a normal mode that provides a first connection condition and a testing mode that provides a second coupling connection condition. The switching unit, in turn, provides connections of at least some of a plurality of outside terminals to the functional circuits, respectively, in the normal mode, and connects at least some of a plurality of outside terminals to the inside terminals in the testing mode. Thus, the normal operation and the testing operation can be carried out without the needs for the external terminals and/or the interposer substrate, which are employed for the purpose of only the testing.
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